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Optical Metrology and Calibration

Optical measurement, metrological calibration, accuracy evaluation, and standards for instruments or components; policy and standards coverage is also classified under the corresponding content-format topic.

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Items 1–4 of 4
Oct 7Wed
  1. Phys.org Optics & PhotonicsOptics industry61

    New chip-scale frequency comb demonstrates potential for portable atomic clocks

    Researchers have demonstrated a new chip-scale optical frequency comb formation process in which two laser beams interact, enabling a range of precision measurements and showing potential for use in portable atomic clocks.

    Why we recommend it: The original article explains the path from chip-based frequency combs to portable timekeeping, serving as a reference for integrated photonic precision measurement

Sep 30Wed
Sep 23Wed
  1. OFweek Optics Network · NewsOptics industry49

    Xinguang Optoelectronics Plans RMB 100 Million Precision Measurement Subsidiary in Hangzhou

    Xinguang Optoelectronics announced on September 22 plans to invest RMB 100 million to establish a wholly owned subsidiary, Hangzhou Xinguang Precision Measurement Systems Co., Ltd., in Hangzhou, with an initial paid-in capital of RMB 10 million. Its main business will cover optical test systems including optical instruments, measurement and inspection equipment, optoelectronic sensors and projection objectives.

Sep 5Fri
  1. Hangzhou Institute of Optics and Fine Mechanics · Recent HighlightsOptics industryOptics and AI29

    Hangzhou Institute of Optics and Fine Mechanics Investment Platform Completes Angel Round in Xishi Technology to Accelerate Industrialization of Domestic High-End Film Thickness Metrology Equipment

    The investment platform of the Hangzhou Institute of Optics and Fine Mechanics has completed an angel-round investment in Xishi Technology. The funds will be used to expand production capacity for high-precision film thickness measurement instruments, upgrade next-generation optical algorithms, and develop the market. Xishi Technology's film thickness gauge product line covers benchtop, vacuum, handheld, line-scan, and OEM modules, with a measurement range from 1 nm to 1 mm and support for both single-layer and multilayer film measurement. Its optical structure and optomechanical system are 100% domestically sourced, and its light source utilization rate is five times that of comparable imported equipment.